Aktuelles

23.09.2016

Workshop: Failure Analysis with Nanoprobing, EBIC and EBAC

The workshop brings together Fraunhofer CAM, Imina Technologies SA and Point Electronic GmbH to present and discuss recent developments in EBIC/EBAC characterization in combination with Nanoprobing.

A range of investigation cases will be discussed with the inputs of experts in both domains. The event will end with a hands-on analysis at Fraunhofer's lab.

The workshop will take place on Friday, 23.09.2016 at Fraunhofer CAM, Heideallee 19, Halle.

Schedule

The workshop will take place on Friday, 23.09.2016 at Fraunhofer CAM, Heideallee 19, Halle.

  • 09.00-12.00 Presentations
  • 12.00-13.00 Lunch
  • 13.00-15.00 Tool Demos


Presentations

  • Microprobing to Nanoprobing workflow in FA using versatile probing platforms
    (Guillaume Boetsch, Imina Technologies SA)
  • Quantitative EBIC and EBAC/RCI techniques
    ​(Dr. Grigore Moldovan, point electronic GmbH)
  • Applications of nano-probing and SEM based current imaging for IC failure analysis
    ​(Jörg Jatzkowski, Fraunhofer CAM)

Registration

Participation is free of charge, but participants need to register before September 14th, 2016 via email to Katja.Stock@imws.fraunhofer.de