DISS 5 EBIC – Quantitative EBIC system
Our hardware and software solution for acquisition and evaluation of EBIC signals on scanning electron microscopes. Learn more:
DISS 5 EBIC Product sheet (size: 146 KB)
Description
DISS 5 EBIC is the combination of a universal digital image acquisition system with a particular measurement amplifier for acquisition and evaluation of EBIC signals in a SEM.
The measurement amplifier was developed in close cooperation with several users to fulfill a large variety of sample-specific requirements.
P-n structures, Schottky barriers and samples from different photovoltaic technologies can be analyzed.
DISS 5 EBIC can be installed with any SEM. Electrical contacting and mounting of the sample as well as the electrical feedthroughs of the EBIC signal to the measurement amplifier will be implemented depending on the specific SEM. The image acquisition system controls the electron beam. Apart from the EBIC signal, it can simultaneously acquire up to 3 other analog signals (SE, RE, CL).
The DISS 5 EBIC software sets all parameters for the image acquisition, controls image acquisition and operates the EBIC measurement amplifier for the adjustment of operation mode, gain, contrast, brightness, zero suppression and zero balance. At the same time, all parameters of the measurement amplifier will be collected to allow for a quantitative evaluation of the EBIC images at a later point. Several additional functions like signal monitor, region scan, live SE+EBIC signal blending, presettable scan functions, recording of the voltage-current characteristic of the sample, configurable interface for the operation of the measurement amplifier and data output in XLS format facilitate working with DISS 5 EBIC.
Hardware
- USB 2.0 interface
- EBIC measurement amplifier:
- Gain (103 … 1010) × (0.1 … 100) V/A
- Bandwidth 0,5 MHz at 109 V/A
- Variable zero suppression, bias voltage
- Scan generator with max. 16 k × 16 k pixels
- Dwell time per pixel 200 ns … 6 ms
- 4 analog signal inputs 12 Bit, signal integration
Software
- Adjustment and saving of all amplifier parameters
- Display of EBIC signal
- Display of voltage-current characteristic of the sample
- Configurable scan functions
- Line Scan, point measurement, signal monitor
- Saving of images with all parameters
- Integrated image evaluation
Overview EBIC measurement amplifier
Specification
Software-controlled setting of measurement amplifier parameters
- Gain preamplifier: 103 … 1010 V/A, level indication to prevent overmodulation
- 8 level low pass filter for noise reduction
- Polarity shifting for negative EBIC signals
- Zero suppression (input offset, 16 Bit) the input signal can be offset completely to map weak contrasts
- Contrast (amplification main amplifier) 0.1 … 100-fold, continuously variable
- Brightness (output offset) -1 … 1 V, 16 Bit
- Zero balance preamplifier
- BIAS voltage adjustment -10 … 10 V, 16 Bit
- Calibrated power source -1 … 1 µA, 16 Bit for testing the system and for equisignal suppression
- Saving and reloading of all parameters
Configured operation mode switching of EBIC measurement amplifier
- EBIC measurement with/without bias voltage
- EBIC measurement with equisignal suppression
- Recording of voltage-current characteristic of the sample
- Beam current measurement internal or via external measurement device
- Zero balance with sample, electron beam turned off
- EBIC measurement with external Lock-In amplifier, activation of Beam Blanker
EBIC image acquisition and image processing
- USB 2.0 interfaces for controlling the EBIC measurement amplifier and for command and data transfer to the active scan generator
- Driver and software for Windows 2000/XP/Vista/Windows 7
- Scan with max. 16.384 × 16.384 pixels, free image format
- 4 × 12 Bit D/A converter for analog input signals, simultaneous acquisition of all image signals
- 12 × 16 Bit counter for mapping and other counting tasks (CL - single photon counting)
- Up to 32.000-fold oversampling for noiseless images, line averaging, frame averaging
- Mains synchronization for slow-scan
- Trigger inputs and clock outputs for point, line, image
- Signal monitor to control image signals, live gradation curves, automatic functions
- Channel mixer for live blending of image signals with selectable color assignment
- Calculation and display of EBIC signal and efficiency for each pixel
- Reduced area scan with zoom for easy focusing and astigmatism correction
- Mapping, line scan, point measurement, region scan, qualitative and quantitative with EDX/WDX
- Export of line profiles as image or measuring data of line scan and point measurements
- AVI function for acquisition of video sequences, with fast motion (optional)
- Thumbnail bar for acquired images, autosave function
- Configurable image acquisition functions, customizable user interface of the measurement amplifier
- TWAIN interface to integrate DISS 5 as OEM product
- Acquisition library for development of specific acquisition software, library to control the EBIC measurement amplifier
- Opening and saving of images in the following file types: TIFF, BMP, JPEG, GIF, PNG
- Saving of important image information in standardized XMP format within TIFF file (EBIC measurement amplifier settings, EBIC formula, magnification, WD, HV, calibration, image acquisition parameters, point scan and line scan data)
- Layout functionality to record and save grouped images
- Printing of single images or layouts, also with different zoom
- Cut-out of image sections, image rotation
- Measurement functions for distances, angles, radii, dimensioning even within the image
- Configurable image caption with micron bar and image parameters, labeling within the image
- False color representation of images, image-mixing function
- Brightness, contrast, histogram function, configurable matrix filter
- Calculation of quantitative line profiles from image data
- Export of point scan, line scan and measuring data as *.xls, *.html, *.txt
- Equidensities representation with area calculation
- Semi-automatic structure measurement (optional)
- Context-sensitive help