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DISS 5 – Digital Image Scanning System

Our hard- and software solution for digital image acquisition and image processing with analog scanning electron microscopes. Learn more:

DISS 5 Product sheet (size: 73 KB)

Description

DISS 5 is an active image acquisition and image processing system for all commercial available electron optical instruments with a scanning device such as scanning electron microscopes and microprobes.

After DISS 5 has been installed, all functions of the SEM are still available. The DISS 5 electronics generates the X- and Y-deflection voltages, digitizes the analog image signals and counts the X-Ray pulses at each pixel for elemental X-Ray mappings.

The digitized images can be processed, labeled, saved, and printed.

DISS 5 Hardware
DISS 5 Hardware

Hardware

  • Scan generator for active electron beam control
  • Max. resolution 16.384 × 16.384 pixels
  • 4 analog signal inputs (SE, BSE, CL)
  • 12 counter inputs (X-Ray mapping)
  • USB 2.0 interface
  • Size of box: 235 × 290 × 90 mm
DISS 5 user interface
DISS 5 Software

Software

  • TV scan, slow scan, mapping, line scan, point measurement
  • Reduced area scan with zoom
  • AVI function with fast motion
  • Constructable, configurable scan buttons
  • Signal monitor with live gradation curve
  • Integrated image processing

Specification

Function Specification
Image acquisition
  • USB 2.0 interface for command and data transfer
  • Compatible with Windows 2000 up to Windows 7
  • Active scan generator
  • Max. 16.384 × 16.384 pixels, free image format
  • 4 × 12 bit D/A converter for analog image signals
  • 12 × 16 bit counter for mapping
  • Live image with 15 fps and 512 × 512 pixels resolution
  • Simultaneous acquisition of all image signals
  • Up to 32.000× oversampling for noise-free images
  • Line averaging, frame averaging
  • Reduced area scan with zoom for easy focusing and astigmatism correction
  • Mapping, line-scan, point measurement, ROI-scan, qualitative and quantitative with EDX/WDX
  • Export of line profiles as image or measuring data of line-scan and point measurements
  • AVI-function for acquistion of video sequences, with fast-motion (optional)
  • Channel-mixer for live-mixing of the image signals with selectable colour classification, Topo/Combo function
  • Signal monitor to control image signals, live gamma and gradation curves
  • System can be calibrated by software to every SEM, saveable calibration sets for various Mag, HV, WD
  • Trigger-inputs and clock-outputs for point, line, image
  • Mains synchronization for slow-scan
  • Thumbnail bar for acquired images
  • Report generator (optional)
  • Configurable image acquisition functions for routine actions:
    • Scan buttons can be added, configured and labeled
    • Signal sources, image resolution and image format
    • Oversampling up to 32.000×
    • Line averaging up to 50×
    • Frame averaging up to 256×
    • Gate time for mapping
    • Automatic for brightness and contrast
  • TWAIN interface to integrate DISS 5 as OEM product
  • Acquisition library for creation of individual acquisition software
  • Context sensitive online help
Image processing
  • Compatible with Windows 2000 up to Windows 7
  • Image browser
  • Loading of the following filetypes: TIFF, BMP, JPEG, PNG, GIF
  • Saving of images in the following filetypes: TIFF, BMP, JPEG, PNG, GIF
  • Saving of image data, calibration, point-, linescan data with the image
  • Auto-save function
  • Layout functionality to save belonging together images
  • Printing of single images or layouts, also with different zoom
  • Creation of image sections
  • Image rotation
  • Measurement functions for distances, angles and radii in image
  • Image labelling
  • configurable image caption with micron bar and image parameters
  • False color representation of images, image-mixing function
  • Brightness, contrast, histogram function, configurable matrix filter
  • Equidensities representation with area calculation (optional)
  • Export of point scan, line scan and measurement data as *.xls, *.html, *.txt (optional)
  • Semi-automatic structure measurement (optional)
  • Phase analysis (optional)
  • Context sensitive online help

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