SEM Upgrades
Complete electronics and software upgrades for all SEM types
The REM Upgrade provides your electron microscope with new cutting-edge electronics and software, including new power supplies for lenses and scanning coils, new controllers for vacuum, high-voltage and stage, new amplifiers for electron detectors, and new scan generator for image acquisition.
Every microscope configuration and install is carefully tailored for each customer.
Our upgrades
- extend the lifetime of your reliably working electronic column
- increase performance thanks to state-of-the-art electronics and software
- enhance network compatibility
- enable new techniques at your SEM
- integrate your existing high-value attachments or workflows
- save acquisition and service costs
What is included?
The upgrade kits consist of hardware, software and selectable options.
Advantages in detail:
State-of-the-art technology
- Windows 11 with network compatibility
- Simultaneous acquisition of multiple signals and detectors
- Fully integrated automation functions
- High-quality hard panels for imaging and stage control
- faster results from sample insertion to final image
Reduce costs
- Extended lifetime
- Lower costs of ownership
- Reduced/no downtime
- 10+ years spare part support
- Maintain proven workflows
- Keep customized add-ons, avoiding time and costs for reconfigurations
- Universal GUI for all upgraded tools independent of manufacturer
Sustainability
- Eco-friendly: upgrading an existing instrument instead of scrapping
- Up to 3x lower power consumption
- Shorter repair times & remote support
- Avoiding long lasting tenders and purchase processes
Costs of Ownership
Compared to a purchase of a new electron microscope, our SEM upgrade significantly saves costs in the long and in the short term.
New electronics for the complete SEM
- New control of gun HV and electron detectors
- New bipolar or unipolar high power supply
- New scan module for single or double deflection coils
- 12 digital input signals (X-ray mapping)
- 19 inch, 10U form factor size
- Standard USB 2.0 interface
MICS-4 signal amplifier
- For extendend imaging channels, from 4x to 16x
- Channel independendt controls for brightness and contrast
- Advanced input offset and gain controls and calibration
- USB2 controlled and fully integrated with the microscope control software
Stage controller
- For automatic positioning and rotation
- Integrated click-and-move, rotation and large area map acquisition
- Configurable software limits for collision avoidance
- USB2 controlled and fully integrated with the microscope control software
SEM control software
- Control of coils and detectors
- Display of measured values
- Load and save of SEM parameters
- Auto-function for focus/stigmator and brightness/contrast
- TV scan, slow scan, mapping, line scan, point measurements
- Reduced area scan with zoom
- AVI-function with time lapse
- Configurable image acquisition functions for routine actions: Scan buttons can be added, configured and labeled so as signal sources, image resolution, image format
- Integrated vacuum-controller, visualization of vacuum scheme
- Integrated sample stage controller – preset, load and save sample- and stage positions
- Signal monitor with live gradation-curve
- Display and setting of ir-chamberscope
- Integrated image processing software
- Live 3D reconstruction with BSE-detector (optional)
- AutoSEM for automated capture of multiple sample locations (optional)
Activity monitor
- For detailed information and preventive maintenance
- Automatic acquisition and complression of microscope operation parameters
- 16x 16-bit analog signal inputs, and software API for loggin events
- Live and offline viewer with PDF exoport
- USB 2.0 controlled and integrated with the new microscope control software
Control panels
- For increased speed and productivity of experienced users
- SEM panel with magnification, focus, image shift, brighness, contrast, stigmatism, etc.
- Stage panel with trackball or joystick, XYRZ locks and store/recall functions
- USB2 controlled and fully integrated wth the microscope control software
MICS 8 / 12 / 16 signal amplifier
- For extendend imaging channels, by 8x, 12x or 16x
- Channel independendt controls for brightness and contrast
- Advanced input offset and gain controls and calibration
- USB2 controlled and fully integrated with the microscope control software
EA amplifiers
- Calibrated high-speed electronics, with in-situ and ex-situ preamplifiers
- Complex multi-stage amplification for imaging, with automatic low-pass filter
- Integrated pico-ammeter for beam current measurements
- Integrated voltage source for biasing
- Integrated current source for compensation
EDS detector
- QUANTAX Compact system by Bruker, containing XFlash® 730M silicon drift detector (SDD), an electronic module, and ESPRIT Compact software
- Allows line scanning and spectral element mapping
- Qualitative and quantitative material analyses
- Fast analysis and reporting
HT BSE detector
- 4Q segmented electrodes with built-in biasing
- Electrodes are light-blind and compatible with laser heating
- Bias voltage to repel secondary electrons and thermal electrons
- Electrodes can be coated in various materials
- easy to disassemble, cleane and recoat
Premium BSE detector
- Four quadrant Si sensor for advanced BSE work
- In-situ preamplification for optimum efficiency and speed
- Optional low-kV sensors
microShape
- Offline 3D viewer of BSE topography data
- Measurement of line profiles, heights, distances and angles in 3D
- 3D data processing including data correction and overlay
microCal
- Offline 3D calibration and reporting software
- Automated calculation of scales and shearing between all coordinate axes
- Analyses of non-linear scanning deviations
Further options
Additional add-ons and software on demand.
Have a look at our portfolio or contact us.