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UID:a306ddc740e6b9e075f59cdda72c2e66
DTSTAMP:20260809T114758Z
SUMMARY:Practical Aspects of Surface Roughness Measurements with Topographi
 c SEM
DESCRIPTION:In our poster\, we present SEM as an effective method for surfa
 ce roughness measurements\, capable of characterizing samples across micro
 - to nanometer scales with higher lateral resolution than conventional opt
 ical techniques.\n\nWe demonstrate this by comparing SEM-measured roughnes
 s values against a commercial silicon roughness standard\, using our point
  electronic BSE-topography system and MountainsMap software for ISO 25178-
 compliant analysis.\n\nPoster Session 1
URL:https://www.pointelectronic.de/en/company/events/imc21-2026/
DTSTART;TZID=Europe/London:20260831T173000
DTEND;TZID=Europe/London:20260831T183000
LOCATION:Liverpool\, United Kingdom
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