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UID:2341263b220b5f1b10636b2cc1e9f4a8
DTSTAMP:20260630T074021Z
SUMMARY:Advances in Quantitative STEM EBIC
DESCRIPTION:In our talk\, we present advances in quantitative STEM EBIC (El
 ectron Beam Induced Current) measurements\, introducing a hardware calibra
 tion approach that directly converts raw image pixel values into physical 
 current values in nA - without requiring recalibration when instrument set
 tings change.\n\nThe method further provides a streamlined workflow for ba
 ckground removal and automated line profile fitting\, enabling extraction 
 of physical parameters such as the effective minority carrier diffusion le
 ngth in semiconductor devices.\n\nAll calibration data is stored in the im
 age file metadata\, making the full quantitative workflow accessible onlin
 e and offline without any additional coding.
URL:https://www.pointelectronic.de/en/company/events/microscopy-and-microan
 alysis-2026/
DTSTART;TZID=America/Chicago:20260805T141500
DTEND;TZID=America/Chicago:20260805T151500
LOCATION:Milwaukee\, USA
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