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UID:2691b302e045a3d7bcef5081a32d0a4b
DTSTAMP:20260630T074000Z
SUMMARY:Measurement of Surface Roughness with SEM
DESCRIPTION:In our talk\, we present SEM as an effective method for surface
  roughness measurements\, capable of characterizing samples across micro- 
 to nanometer scales with higher lateral resolution than conventional optic
 al techniques.\n\nWe demonstrate this by comparing SEM-measured roughness 
 values against a commercial silicon roughness standard\, using our point e
 lectronic BSE-topography system and MountainsMap software for ISO 25178-co
 mpliant analysis.
URL:https://www.pointelectronic.de/en/company/events/microscopy-and-microan
 alysis-2026/
DTSTART;TZID=America/Chicago:20260805T133000
DTEND;TZID=America/Chicago:20260805T143000
LOCATION:Milwaukee\, USA
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DTSTART:20260805T133000
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