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BEGIN:VEVENT
UID:697651e9bc1714ea6a9e937a5afc38e8
DTSTAMP:20260721T005838Z
SUMMARY:High Spatiotemporal STEM Using Beam Position Correction via Scan Sh
 aping
DESCRIPTION:This poster demonstrates how scan shaping enables high-speed ST
 EM imaging beyond traditional coil limitations\, achieving 41 fps at 512×
 512 with 60 ns pixel dwell time. The team of Trinity College Dublin implem
 ented a method of scan shaping\, based on a serpentine scan to achieve hig
 h temporal and spatial resolution imaging. The poster also discusses new l
 imiting factors to STEM scan speeds\, and approaches to increasing framera
 tes further.
URL:https://www.pointelectronic.de/en/company/events/microscopy-and-microan
 alysis-2026/
DTSTART;TZID=America/Chicago:20260805T150000
DTEND;TZID=America/Chicago:20260805T160000
LOCATION:Milwaukee\, USA
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DTSTART:20260805T150000
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