Add-ons/Options

Basic BSE detector

Flexible and affordable four-quadrants BackScattered Electron (BSE) detector

Benefits

  • Map changes in atomic number/Z-contrast across the sample
  • Reveal grains of different orientations
  • Distinguish between materials and topographic contrast
  • Identify features for advanced analytical techniques
  • Produce colour images by mixing multiple signals
  • Measure height with the optional topograhic shape-from-shadow reconstruction

Features

  • In situ preamplification for minimum noise and maximum speed
  • Hybrid chips-on-board design for low cost and flexible construction
  • Simmultaneous four channels for topographic/compositional contrast

Specifications

  • Sensor type: optics-grade Si diodes
  • Sensor mount: 4x chips on ceramic board
  • Sensor size: 5x5 or 10x10 mm rectangular
  • Sensor sensitivity: 5 kV minimum acceleration voltage
  • Sensor size: 25 mm outer diameters, 1.2 mm height
  • Pre-amplifier mount: 4x in situ channels
  • Pre-amplifier gain: 10^6, 10^7 or 10^8 V/A gain (factory configurable)
  • Pre-amplifier size: 18 mm width, 22 mm lenght
  • Electrical feedthrough: 10-pin LEMO
  • Electrical connector: D-Sub 9-pin (factory configurable)
  • Detector speed: 8 µs minimum dwell time
  • Detector mount: pole-piece or insertion/retraction mechanism

Pictures