Accessories

Structure measurement

Extension module for DIPS for semi-automatic measurement of semiconductor structures

  • semi-automatic measurement of semiconductor structures to minimize measurement errors
  • threshold method: the user can select the edges to measure by mouse, the software automatically aligns the measurement cursors to the specified threshold between edge minimum and edge maximum
  • several lines can be averaged for the measurement
  • spline interpolation for noise suppression, enables measurements in sub-pixel range
  • line profile for visual control and display of the measured distance in the image
  • measured distance can be burned into the image together with a dimensioning label
  • measured values can be taken over into a measurement table

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