Veranstaltungen (Archiv)

23.09.201623.09.2016

Workshop: Failure Analysis with Nanoprobing, EBIC and EBAC

The workshop brings together Fraunhofer CAM, Imina Technologies SA and Point Electronic GmbH to present and discuss recent developments in EBIC/EBAC characterization in combination with Nanoprobing.

  • Fraunhofer CAM
  • Halle (Saale) (Deutschland)