Identify elements and map composition in SEM and FIB-SEM with the most practical and affordable Energy Dispersive X-Ray Spectroscopy (EDS) for SEM and STEM. Correlate structure and composition at the micro- and nano- scale with the IDFix user interface for common EDS workflows, and the most powerful and versatile SEM acquisition system – DISS5.
- Completely integrated EDS and SEM acquisition hadrware
- Practical and uncomplicated Silicon Drift Detector (SSD)
- Automatic and manual composition quantification methods
- Complete analysis control with standard methods for SEM and STEM
