SEM controls

SEM controls

Universal and fully integrated control system for all Scanning Electron Microscopes and Microanalysers.

Take control over your microscope with new cutting-edge electronics and software, including control of all electron-optics on the column, electron gun power supply, all electron detectors, sample stage and chamberscope.

  • Increase reliability, reduce downtime and minimise service costs with highest quality electronics
  • Maximise productivity and efficiency of your SEM with integrated and universal software
  • Use our new automatic functions: auto-focus, auto-brightness, auto-contrast
  • Connect your SEM to any Microsoft Windows PC or laptop with USB interface
  • Use standard PC input or add the optional USB SEM control panel
  • Enjoy the power and versatility of DISS5 image acquisition software
  • Make calibrated measurements with the integrated DIPS image processing software
  • Automate complex dependencies between microscope control parameters
  • Improve the performance of the SEM with optional electron detectors
  • See your chamber in operation with optional IR chamberscope
  • Extend the use of the SEM with optional EBIC, EBAC/RCI amplifiers
  • See the third dimension in your SEM with the optional live 3D electron topography package
  • Enhance your analysis with optional structure measurement software
  • Bring nanomanufacture to your SEM with the optional e-beam lithography software package

Every microscope configuration and install is carefully tailored for each customer, as microscope customization and upgrades are at the core of the company ethos.