Our workshop 'EBIC on the TEM - STEBIC', held in collaboration with Dresden Center for Nanoanalysis (DCN) at the Technical University of Dresden today, was great and interesting exchange with everyone!

Offering a practical hands-on experience, the workshop gave the opportunity to experience and discuss what is now possible to achieve with new developments in Electrical Analysis in the TEM. The spotlight was on the Scanning Transmission Electron Beam Induced Current (STEBIC) technique for mapping internal fields in junctions and devices.

STEBIC represents a new advancement in TEM for the research and characterization of novel nano-devices in optoelectronics, photovoltaics, power applications, and advancements in failure analysis for CMOS technology.

Our live demo showed TEM sample preparation, the key hardware and software equipment for EBIC in the TEM and its setup. The technique was then showcased in action on the JEOL F-200 TEM at DCN.

A big thanks to our colleague René Hammer, who led the workshop, along with our colleague Mathias Mosig, the DCN at Technische Universität Dresden with Bernd Rellinghaus and his team, and all who organised and took part!