EA Amplifier for TEM – point electronic GmbH

The miniature amplifier is designed for Electrical Analysis techniques in TEM, to amplify currents induced by the electron beam in internal fields of nanodevices and TEM lamellas.

For minimum noise and maximum speed in image acquisition, it mounts directly on TEM biasing holders. It includes the first stage of amplification with a wide configurable gain, a bias voltage source and current compensation with current limits and automatic IV sweep, a switchable low pass for signal filtering and an automated zero/dark adjustments for quantification.

Electron Beam Induced Current (EBIC)

map internal electric fields in semiconductors and ceramics
characterise electrical activity of defects
localise material and/or processing defects

make

Input channels

4x to in-situ biasing holder, or
6x to in-situ biasing holder

Routing

EA high (pre-amplifier)
EA low (ground or bias voltage)
External

Preamplifier

10⁴ … 10⁹ V/A variable gain
approx. 100 kHz bandwidth at 10⁷ V/A

Internal sources

-5 … 5 V, 16-bit bias voltage
-1 ... 1 µA, 16-bit compensation current
10 µA, 30 µA and 100 µA bias current limits

EA amplifier for TEM

Papers

The emergence of Electrical Analysis in electron microscopy PDF

Electrical Analysis for TEM brochure PDF