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Awarding of the Heinz Bethge Prizes 2026
point electronic supports for the second time in a row -
Publication about the first combined use of 4D-STEM and STEM-EBIC techniques
"In-Operando 4D-STEM and STEM-EBIC Imaging of Electric Fields and Charge Carrier Behavior in Biased Silicon p–n Junctions.", published in Advanced Electronic Materials.