ISTFA 2026
Oct 4, 2026 - Oct 8, 2026
- Henry B. Gonzalez Convention Center
- San Antonio, USA
- Booth no. 710
- www.asminternational.org
About ISTFA:
The 52nd International Symposium for Testing and Failure Analysis (ISTFA) is an important international event for the microelectronics failure analysis community.
You find us at booth 710 of our US partner Angstrom Scientific.
point electronic's topics on site:
- Electrical Analysis
- Electrical Failure Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
Your contact on site:
Don't miss our presentations.
Low noise STEBIC on low resistive samples
Friday, October 9, 2026
10:50 (America/North_Dakota/Center)
Our talk at ISTFA 2026 presents a novel solution for low-noise STEM EBIC measurements on low-resistive samples. While STEM EBIC offers direct access to internal electric fields and device parameters like minority carrier diffusion length and depletion region width, sample preparation is challenging. Structural defects (amorphous layers, metal redeposition, ion implantation) create parasitic resistances that increase low-frequency noise in STEM EBIC measurements. Our novel preamplifier module enables reliable measurements even on lamellae with low parallel resistance, reducing time-consuming iterative preparation and minimizing overall effort.
Our contact: info@pointelectronic.de
René Hammer
Product Manager / Scientist
Add to calendar:
make