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Techniques

Fully supported methods, from demos to installation, training and support

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  • Techniques

3D Calibration

Calibration technologies in 3D microscopy for fast and accurate calibration
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BSE Topography

Live quantitative surface topography from BSE signals
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Electron Counting

Low-dose imaging with single electron counting
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Pseudo-colour EBAC image of Au grains on Carbon, showing Orientation Contrast

EBAC

Advanced imaging mode for environmental and high-temperature SEM
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RCI

Low noise imaging of low-impedance structures
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EBIRCh

Easy localisation with live colour imaging.
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DISS 5 EBIC – quantitative electronics and software for Electron Beam Induced Current instruments

EBIC

Electron Beam Induced Currents in scanning electron microscopes
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point electronic GmbH
Erich-Neuß-Weg 15
06120 Halle (Saale)
Germany

  • P: +49 345 1201190
  • P: +49 345 1201223
  • E: info@pointelectronic.de
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