Geometrical Analysis
What is geometric analysis in the electron microscope?
Geometrical analysis in SEM is a growing set of related techniques and tools dealing with measurement and management of locations, distances, angles, shapes, volumes and derrived parameters. Current emphasis is on techniques that enable three dimensional (3D) exploration and modelling of microstructures.
These advanced techniques have taken a leap based on the latest generation of calibrated electronics and quantitative software, which reduce complexity in operation, automate reconstruction algorithms and improve accuracy of final results.
Our Solutions
Discover techniques, solutions, and products tailored for geometrical analysis in the electron microscope.
Techniques: Solutions for techniques such as BSE Topography or 3D Calibration
Systems: comprehensive solutions for applications such as Topographic Analysis or the point electronic 3D Calibration Kit
Parts: point electronic products for advanced geometrical analysis

BSE Topography
Live quantitative surface topography in SEM from BSE signals
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3D Calibration
Calibration technologies in 3D microscopy for fast and accurate calibration of electron and light microscopes.
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Topographic Analysis
System for live and calibrated height measurements, with SEM or FIB-SEM
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3D Calibration Kit
System for topography calibration for electron microscopes.
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BSE Acquisition
Quantitative BackScattered Electron (BSE) acquisition system
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3D calibration standards
- Marker based 3D structures for X, Y, Z calibration
- Reference information traceable to Physikalisch-Technische Bundesanstalt (PTB)
- With reference marks for automated calibration

Premium BSE detector
- Four quadrant Si sensor for advanced BSE work
- In-situ preamplification for optimum efficiency and speed
- Optional low-kV sensors

MICS signal amplifier
- For extendend imaging channels, from 4x to 16x
- Channel independendt controls for brightness and contrast
- Advanced input offset and gain controls and calibration
- USB2 controlled and fully integrated with the microscope control software
- optional installed in the BSE retraction mechanism

DISS6 SEM Scan Controller
- High-performance calibrated electronics for image acquisition
- Integrated and automated amplification of BSE signals
- With truly simultaneous acquisition of all BSE signals

DISS6 acquisition with topography plugin
- Software for live BSE topography reconstruction and visualisation
- Quantitative image acquisition and detector control
- Height and texture save to standard file formats

microShape
- Offline 3D viewer of BSE topography data
- Measurement of line profiles, heights, distances and angles in 3D
- 3D data processing including data correction and overlay

microCal
- Offline 3D calibration and reporting software
- Automated calculation of scales and shearing between all coordinate axes
- Analyses of non-linear scanning deviations

DIPS6 image processing
- Software for display of quantitative image data
- Inspection of acquisition settings in metadata
- Extraction of quantitative pixel values
Papers
- Cervical wear pathobiology by robot-simulated 3-year toothbrushing PDF
- In-Situ microscopy study on self-healing process of vitrimers PDF
- Automated Geometric SEM Calibration PDF
- Fracture characteristics and fracture mechanisms using deep learning and topography data PDF
- Development of Geometrical Analysis in SEM PDF