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SEM electron microscope modernised by point electronic

SEM Modernization

Cutting-edge electronics and software for SEMs, for extended life and warranty time
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TEM Modernization

Complete electronics and software for ZEISS EM 109/900 TEMs
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SEM Electrical Analysis

quantitative electronics and software for electrical analysis in SEM and FIB/SEM.
discover

TEM Electrical Analysis

In-situ imaging of electrical activity at the nanoscale
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Electrical Failure Analysis

Equipment for entry-level to cutting edge
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BSE Acquisition

Quantitative BackScattered Electron (BSE) acquisition system
discover

Topographic Analysis

Live and calibrated height measurements
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3D Calibration Kit

Topography calibration for electron microscopes
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STEM Counting

Low-dose imaging with single electron counting
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Digital Image Scanning

Digital Image Scanning System (DISS) for SEM and TEM
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Custom Electronics

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point electronic GmbH
Erich-Neuß-Weg 15
06120 Halle (Saale)
Germany

  • P: +49 345 1201190
  • P: +49 345 1201223
  • E: info@pointelectronic.de
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