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Systems

Complete solutions from a single source

  • Home
  • Systems

Digital Image Scanning

Digital Image Scanning System (DISS) for SEM and TEM
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Electrical Analysis for TEM

In-situ imaging of electrical activity at the nanoscale
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Electrical Analysis for SEM

quantitative electronics and software for electrical analysis in SEM and FIB/SEM.
discover

Electrical Failure Analysis

Equipment for entry-level to cutting edge
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Topographic Analysis

Live and calibrated height measurements
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BSE Acquisition

Quantitative BackScattered Electron (BSE) acquisition system
discover

STEM Counting

Low-dose imaging with single electron counting
make

3D Calibration Kit

Topography calibration for electron microscopes
explore

TEM Upgrade Kit

Complete electronics and software for ZEISS EM 109/900 TEMs
discover

SEM Upgrade Kit

Cutting-edge electronics and software for SEMs, for extended life and warranty time
make
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point electronic GmbH
Erich-Neuß-Weg 15
06120 Halle (Saale)
Germany

  • P: +49 345 1201190
  • F: +49 345 1201223
  • E: info@pointelectronic.de
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