![SEM electron microscope modernised by point electronic SEM electron microscope modernised by point electronic](/media/3551/sem_upgrade_kit_-_point_electronic_-_1280x420_2.png)
SEM Modernization
Cutting-edge electronics and software for SEMs, for extended life and warranty time
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TEM Modernization
Complete electronics and software for ZEISS EM 109/900 TEMs
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SEM Electrical Analysis
quantitative electronics and software for electrical analysis in SEM and FIB/SEM.
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TEM Electrical Analysis
In-situ imaging of electrical activity at the nanoscale
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Electrical Failure Analysis
Equipment for entry-level to cutting edge
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BSE Acquisition
Quantitative BackScattered Electron (BSE) acquisition system
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Topographic Analysis
Live and calibrated height measurements
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3D Calibration Kit
Topography calibration for electron microscopes
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STEM Counting
Low-dose imaging with single electron counting
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Digital Image Scanning
Digital Image Scanning System (DISS) for SEM and TEM
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