EA Amplifiers for TEM
The miniature amplifier is designed for Electrical Analysis techniques in TEM, to amplify currents induced by the electron beam in internal fields of nanodevices and TEM lamellas.
For minimum noise and maximum speed in image acquisition, it mounts directly on TEM biasing holders. It includes the first stage of amplification with a wide configurable gain, a bias voltage source and current compensation with current limits and automatic IV sweep, a switchable low pass for signal filtering and an automated zero/dark adjustments for quantification.
Electron Beam Induced Current (EBIC)
- map internal electric fields in semiconductors and ceramics
- characterise electrical activity of defects
- localise material and/or processing defects
