EA Amplifier for TEM

EA Amplifier for TEM - electronics for in-situ biasing holders

The miniature amplifier is designed for Electrical Analysis techniques in TEM, to amplify currents induced by the electron beam in internal fields of nanodevices and TEM lamellas.

For minimum noise and maximum speed in image acquisition, it mounts directly on TEM biasing holders. It includes the first stage of amplification with a wide configurable gain, a bias voltage source and current compensation with current limits and automatic IV sweep, a switchable low pass for signal filtering and an automated zero/dark adjustments for quantification.

The EA Amplifer is part of the EA for TEM system.

Features

• First stage analog amplification for minimum noise
• Wide gain range for all EA techniques and samples
• Built-in voltage bias and current compensation
• Automated signal routing to avoid electric discharge
• Switchable low passes for signal filtering
• Automated zero adjustment

Electrical Analysis techniques:

Electron Beam Induced Current (EBIC)

• map internal electric fields in semiconductors and ceramics
• characterise electrical activity of defects
• localise material and/or processing defects

make

• EA amplifier for TEM