Topographic Analysis

BSE topography in electron microscopy is utilized to examine surface topographical features at the micro- and nanoscale, helping researchers distinguish variations in height and morphology. This technique is invaluable for characterizing sample surfaces in SEM and FIB-SEM environments.

Our BSE Topography System offers the ability to perform live calibrated height measurements with any SEM or FIB-SEM, enabling researchers to accurately measure surface heights, distinguish topography from composition, monitor in-situ surface changes, visualize complex surfaces in three dimensions, and seamlessly continue live topographical analysis with the convenience of off-line analysis.

The software includes live surface height reconstruction from BSE signals, a built-in 3D surface visualization tool, and the flexibility of configurable workflows with seamlessly integrated SE and BSE scan profiles.

The system consists of hardware and software.

Measure surface height with SEM

• Use conventional segmented BSE signals
• Measure live with automated topographic reconstruction
• Save topographic data in standard file formats

Topography-composition distinction

• Resolve ambiguities in image interpretation
• Reach a wider audience with 3D models, visualisation and printing
• Measure 3D distances and volumes

In-situ surface dynamics

• Record surface evolution during in-situ experiments
• Measure deviations from nominal surface
• Quantify 3D changes for different processes

Complex surfaces in 3D

• Add texture from SE, EDS or EBSD maps
• Apply automatic colour gradients as texture
• Export 3D screenshots for high-impact visualisation

Calibrate and measure heights

• Calibrate measurements with dedicated 3D samples
• Measure 3D positions, distances and angles
• Measure and report height profiles

Live topography with off-line analysis

• Import data into full feature analysis software
• Measure surface roughness and analyse texture
• Analyse morphology, grain and particle distribution