STEM Counting

STEM Counting is a powerful technique widely employed in the fields of materials science and nanotechnology. It used for characterizing nanoparticles, studying crystal defects, and imaging biological specimens at the atomic scale.

Our STEM counting system enables to produce images with calibrated units of individual electrons, ensuring a true zero background level and minimal noise, thereby enhancing the precision and reliability of measurements.

The system consists of hardware, and software.