STEM Counting
STEM Counting is a powerful technique widely employed in the fields of materials science and nanotechnology. It used for characterizing nanoparticles, studying crystal defects, and imaging biological specimens at the atomic scale.
Our STEM counting system enables to produce images with calibrated units of individual electrons, ensuring a true zero background level and minimal noise, thereby enhancing the precision and reliability of measurements.
The system consists of hardware, and software.
TEM Scan Controller (DISS6)
- Integrated scan generator and image acquisition
- Large pixel resolution and high scanning speed
- Second stage digital amplification for EA
- Simultaneous BF, HAADF and EA inputs
MICS-8 amplifier
- Adds analog multichannel signal amplifier
- Independent brightness & contrast for each signal
- Advanced input and gain normalisation for 4Q
Pulse digitiser
- Compatibility: Gresham, Kevex, Noran, Link, EDAX or PGT
- Spectrum size: 1,024, 2,048 and 4,096 channels
- Throughput rates: 300 kcps/channel max.
STEM Detector
- multi-segment detector for STEM
- segmented diode with up to 16 segments
- configurable to detect BF, ABF, ADF, and HAADF on the same plane
- exact segmentation geometry is definable to fit the specific experimental requirements
DISS6 detector control and image acquisition software
- Control of detector and analog discriminator
- Configuration of scans and signals
- Live quantification of pixel values
- Configurable workflows
DIPS6 Image processing app
- Viewer of all image signals and metadata tags
- Selection of pseudo-colour profiles
- Full quantification of pixel values
- Layered colour view of signals