Electrical Analysis
What is electrical analysis with the electron microscope?
A number of techniques are available for electrical analysis (EA) using electron microscopy, which allow fundamental electrical properties of materials and electronic components to be imaged and measured with high spatial resolution.
For example, Electron Beam Absorbed Current (EBAC) as well as Electron Beam Induced Current (EBIC) allow Resistive Contrast Imaging (RCI), to display the spatial distribution of internal fields, to measure the recombination rate at defects etc.
Our Solutions
Discover techniques, solutions, and products tailored for electrical analysis in the electron microscope.
Techniques: Solutions for techniques such as EBIC, EBAC, RCI or EBIRCh
Systems: comprehensive solutions for applications such as electrical analysis for SEM, electrical analysis for TEM or electrical failure analysis
Parts: point electronic products that take your electrical analysis to a new level
RCI
Resistive Contrast Imaging - Low noise imaging of low-impedance structures.
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EBIRCh
Electron Beam Induced Resistance Change - Easy localisation with live colour imaging
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EBIC
Acquisition and analysis of Electron Beam Induced Currents in scanning electron microscopes
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EBAC
Electron Beam Absorbed Current - measurment of Electron Beam Absorbed Currents in electron microscopes. Advanced imaging mode for environmental and high-temperature SEM
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Electrical Analysis for TEM
In-situ imaging of electrical activity at the nanoscale
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Electrical Analysis for SEM
The best quantitative electronics and software for analysis of electrical properties in SEM and FIB/SEM.
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Electrical Failure Analysis
Dedicated equipment for Failure Analysis, from entry-level to the cutting edge.
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EA amplifiers
- Calibrated high-speed electronics, with in-situ and ex-situ preamplifiers
- Complex multi-stage amplification for imaging, with automatic low-pass filter
- Integrated pico-ammeter for beam current measurements
- Integrated voltage source for biasing
- Integrated current source for compensation
EFA Controller
- High-speed multi-stage amplification for imaging, with automated low-pass filter
- Automated signal switch-board for routing
- Automated pico-ammeter for beam current measurements
- Integrated voltage and current sources for biasing and compensation
- Optional low- and high-power PSUs for probe cleaning
- Optional in-situ preamplifiers for low-impedance failure cases
- Optional Current-Voltage (IV) sweeps
DISS6 SEM Scan Controller
- Latest generation electronics for image scanning
- Calibrated 16-bit signal digitization
- Standard 4x simmultaneous SEM signal inputs
- Added 8x simmultaneous inputs for in-situ preamplifiers
- Independent brightness & contrast controls for each signal
REVOLON TEM Scan Controller
- Integrated scan generator and image acquisition
- Large pixel resolution and high scanning speed
- Second stage digital amplification for EA
- Simultaneous BF, HAADF and EA inputs
DISS6 image acquisition
- Integrated software for image acquisition and amplifier control
- Advanced tools for colour mixing, current-voltage (IV) and line scans
- Inspection and export functions of calibrated image data
DIPS6 image processing
- Dedicated software for display of image data
- Inspection of acquisition settings in metadata
- Extraction of quantitative pixel value