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Electrical Analysis

The best quantitative electronics and software for analysis of electrical properties and for In-situ imaging of electrical activity at the nanoscale.

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  • Electrical Analysis
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A number of techniques are available for electrical analysis (EA) using electron microscopy, which allow fundamental electrical properties of materials and electronic components to be imaged and measured with high spatial resolution.

For example, Electron Beam Absorbed Current (EBAC) as well as Electron Beam Induced Current (EBIC) allow Resistive Contrast Imaging (RCI), to display the spatial distribution of internal fields, to measure the recombination rate at defects etc.

  • RCI
  • EBIRCh
  • EBIC
  • EBAC
  • EA Amplifiers for SEM
  • EFA Controller
  • SEM Scan Controller
  • TEM Scan Controller
  • DISS6
  • DIPS6

Papers

  • The emergence of Electrical Analysis in electron microscopy PDF
  • High-resolution resistance mapping in SEM PDF

Slides

  • Combined FIB/EBAC Methods for failure Analysis on IC PDF
  • Evaluation of combined EBIC/FIB methods for solar cell characterization PDF
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point electronic GmbH
Erich-Neuß-Weg 15
06120 Halle (Saale)
Germany

  • P: +49 345 1201190
  • F: +49 345 1201223
  • E: info@pointelectronic.de
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