SEM Upgrade Kit
The Upgrade Kit provides your SEM with new cutting-edge electronics and software, including new power supplies for lenses and scanning coils, new controllers for vacuum, high-voltage and stage, new amplifiers for electron detectors, and new scan generator for image acquisition.
Every microscope configuration and install is carefully tailored for each customer.
The upgrade kits consist of hardware, software and selectable options.

State-of-the-art technology
- Windows 11 with network compatibility
- Simultaneous acquisition of multiple signals and detectors
- Fully integrated automation functions
- High-quality hard panels for imaging and stage control
- faster results from sample insertion to final image

Reduce costs
- Extended lifetime
- Lower costs of ownership
- Reduced/no downtime
- 10+ years spare part support
- Maintain proven workflows
- Keep customized add-ons, avoiding time and costs for reconfigurations
- Universal GUI for all upgraded tools independent of manufacturer

Sustainability
- Eco-friendly: upgrading an existing instrument instead of scrapping
- Up to 3x lower power consumption
- Shorter repair times & remote support
- Avoiding long lasting tenders and purchase processes

Costs of Ownership
Compared to a purchase of a new electron microscope, our SEM upgrade significantly saves costs in the long and in the short term.

New electronics for the complete SEM
- New control of gun HV and electron detectors
- New bipolar or unipolar high power supply
- New scan module for single or double deflection coils
- 12 digital input signals (X-ray mapping)
- 19 inch, 10U form factor size
- Standard USB 2.0 interface

MICS-4 signal amplifier
- For extendend imaging channels, from 4x to 16x
- Channel independendt controls for brightness and contrast
- Advanced input offset and gain controls and calibration
- USB2 controlled and fully integrated with the microscope control software

Stage controller
- For automatic positioning and rotation
- Integrated click-and-move, rotation and large area map acquisition
- Configurable software limits for collision avoidance
- USB2 controlled and fully integrated with the microscope control software

SEM control software
- Control of coils and detectors
- Display of measured values
- Load and save of SEM parameters
- Auto-function for focus/stigmator and brightness/contrast
- TV scan, slow scan, mapping, line scan, point measurements
- Reduced area scan with zoom
- AVI-function with time lapse
- Configurable image acquisition functions for routine actions: Scan buttons can be added, configured and labeled so as signal sources, image resolution, image format
- Integrated vacuum-controller, visualization of vacuum scheme
- Integrated sample stage controller – preset, load and save sample- and stage positions
- Signal monitor with live gradation-curve
- Display and setting of ir-chamberscope
- Integrated image processing software
- Live 3D reconstruction with BSE-detector (optional)
- AutoSEM for automated capture of multiple sample locations (optional)

Activity monitor
- For detailed information and preventive maintenance
- Automatic acquisition and complression of microscope operation parameters
- 16x 16-bit analog signal inputs, and software API for loggin events
- Live and offline viewer with PDF exoport
- USB 2.0 controlled and integrated with the new microscope control software

Control panels
- For increased speed and productivity of experienced users
- SEM panel with magnification, focus, image shift, brighness, contrast, stigmatism, etc.
- Stage panel with trackball or joystick, XYRZ locks and store/recall functions
- USB2 controlled and fully integrated wth the microscope control software

MICS 8 / 12 / 16 signal amplifier
- For extendend imaging channels, by 8x, 12x or 16x
- Channel independendt controls for brightness and contrast
- Advanced input offset and gain controls and calibration
- USB2 controlled and fully integrated with the microscope control software

EA amplifiers
- Calibrated high-speed electronics, with in-situ and ex-situ preamplifiers
- Complex multi-stage amplification for imaging, with automatic low-pass filter
- Integrated pico-ammeter for beam current measurements
- Integrated voltage source for biasing
- Integrated current source for compensation

EDS detector
- QUANTAX Compact system by Bruker, containing XFlash® 730M silicon drift detector (SDD), an electronic module, and ESPRIT Compact software
- Allows line scanning and spectral element mapping
- Qualitative and quantitative material analyses
- Fast analysis and reporting

HT BSE detector
- 4Q segmented electrodes with built-in biasing
- Electrodes are light-blind and compatible with laser heating
- Bias voltage to repel secondary electrons and thermal electrons
- Electrodes can be coated in various materials
- easy to disassemble, cleane and recoat

Premium BSE detector
- Four quadrant Si sensor for advanced BSE work
- In-situ preamplification for optimum efficiency and speed
- Optional low-kV sensors

microShape
- Offline 3D viewer of BSE topography data
- Measurement of line profiles, heights, distances and angles in 3D
- 3D data processing including data correction and overlay

microCal
- Offline 3D calibration and reporting software
- Automated calculation of scales and shearing between all coordinate axes
- Analyses of non-linear scanning deviations

Further options
Additional add-ons and software on demand.
Have a look at our portfolio or contact us.
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Hardware
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Software
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