The QUANTAX Compact system comprises an XFlash® 730M silicon drift detector (SDD), a compact electronic module, and user-friendly ESPRIT Compact software. It is proficient in both qualitative and quantitative material analyses, encompassing elements from boron (5) to californium (98).
In addition to conducting compositional assessments at specific sample locations, QUANTAX Compact boasts robust features for line scanning and spectral element mapping. With the use of QUANTAX Compact, analysis and reporting are swiftly completed, taking only seconds.
