M&M 2026
Aug 3, 2026 - Aug 6, 2026
- The Baird Center
- Milwaukee, USA
- Booth no. #329
- mmconference.microscopy.org
About Microscopy and Microanalysis 2026:
The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students and exhibitors in the world.
Microscopy & Microanalysis provides a forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.
point electronic's topics on site:
- REVOLON TEM scan controller: Fastest scanning and 4D STEM synchronization with open access to beam control via SDK and Python code.
- DISS6 SEM scan controller: highest-performance and most versatile scan generator and imaging system
- Topographic Analysis: quantitative and calibrated measurement of surface height with live 3D visualization
- SEM Modernizations: A second life for your existing SEM – with complete new electronics and software for the fraction of the costs of a new microscope.
- OEM/ODM Electronics and Software: High-speed, reliable and cost-efficient design solutions ready for series production.
- Electrical Analysis in TEM: Correlation of electrical activity with high resolution data
- Electrical Analysis in SEM: Electrical Analysis system for high-quality visualization of electronic properties and defects
Your contacts on site:
Don't miss our presentations.
Measurement of Surface Roughness with SEM
Wednesday, August 5, 2026
1:30 PM (America/Chicago)
Room S202 A
In our talk, we present SEM as an effective method for surface roughness measurements, capable of characterizing samples across micro- to nanometer scales with higher lateral resolution than conventional optical techniques.
We demonstrate this by comparing SEM-measured roughness values against a commercial silicon roughness standard, using our point electronic BSE-topography system and MountainsMap software for ISO 25178-compliant analysis.
Dr. Grigore Moldovan
CTO
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Advances in Quantitative STEM EBIC
Wednesday, August 5, 2026
2:15 PM (America/Chicago)
Room S 101 D
In our talk, we present advances in quantitative STEM EBIC (Electron Beam Induced Current) measurements, introducing a quantification method based on hardware calibration and quantitative software, which is then applied to extraction of effective minority carrier diffusion length. It converts raw image pixel values into physical current values in nA - without requiring recalibration when instrument settings change.
The method further provides a streamlined workflow for background removal and automated line profile fitting, enabling extraction of physical parameters such as the effective minority carrier diffusion length in semiconductor devices.
All calibration data is stored in the image file metadata, making the full quantitative workflow accessible online and offline without any additional coding.
Dr. Grigore Moldovan
CTO
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From Knobs to Code: open scan control meets single electron counting for data driven microscopy
Tuesday, August 4, 2026
5:45 PM (America/Chicago)
at our point electronic booth 329
This Vendor Tutorial is aimed at microscopists and “makers” who want to move beyond default scan modes toward programmable, data driven workflows.
Familiarity with STEM or SEM operation is assumed, but no specific programming background is required.
Focus will be on practical concepts, latest results, and implementation pathways that participants can bring back to their own instruments.
Joint Vendor Tutorial mit Lewys Jones, turboTEM.
Tuesday, 5:45 p.m.
Dr. Grigore Moldovan
CTO
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Future-Proof your SEM: How Modernizations will give your SEM a second life
Wednesday, August 5, 2026
5:45 PM (America/Chicago)
at our point electronic booth 329
> Is your SEM column still going strong, but the electronics and software are outdated?
> Did you know that you can modernize your SEM with a modern, low-interference, high-speed electronics package and boost performance and efficiency for years to come?
With SEM Modernization from point electronic, you can enjoy user-friendly software, automation, and OS compatibility, all at a fraction of the cost of a new SEM.
Attend our vendor tutorial and learn why 320+ customers chose to modernize their SEMs and make them state-of-the-art with point electronic.
Wednesday, 5:45 p.m.
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High Spatiotemporal STEM Using Beam Position Correction via Scan Shaping
Wednesday, August 5, 2026
3:00 PM (America/Chicago)
P02.01 - Poster 258
This poster demonstrates how scan shaping enables high-speed STEM imaging beyond traditional coil limitations, achieving 41 fps at 512×512 with 60 ns pixel dwell time. The team of Trinity College Dublin implemented a method of scan shaping, based on a serpentine scan to achieve high temporal and spatial resolution imaging. The poster also discusses new limiting factors to STEM scan speeds, and approaches to increasing framerates further.
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