New Potentials in Quantitative STEM with Open Scan Control and Pulse Counting

Tuesday, September 1, 2026
4:45 PM (Europe/London)
Room 3B

In this talk, our partner Daesung Park from Physikalisch Technische Bundesanstalt (PTB) presents how combining an open TEM scan controller (REVOLON) with single-electron pulse counting (PULSE) enables faster, low-noise and fully calibrated quantitative HAADF-STEM imaging. We show that advanced scan paths (such as serpentine, spiral and Hilbert patterns) and post‑processing of scan-coil hysteresis overcome flyback and distortion limits of conventional raster scanning, allowing robust nanometrology at atomic resolution.

Our contact: info@pointelectronic.de

Tuesday - Room 3B

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Fixing your field of view: Predictive drift compensation for in-situ STEM and distortion-free imaging

Tuesday, September 1, 2026
5:15 PM (Europe/London)
Talk: room 3A

This talk presents a new open-source method for predictive drift compensation in STEM, designed to correct sample movement during acquisition before it degrades image quality. The team of Trinity College Dublin and Universtiy of Warwick demonstrate how live scan modification can preserve field of view, reduce blur and shear, and improve both rigid and pixelwise drift correction across demanding imaging conditions. For their research, they were using our point electronic REVOLON.

Talk: room 3A

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Practical Aspects of Surface Roughness Measurements with Topographic SEM

Monday, August 31, 2026
5:30 PM (Europe/London)
Poster Session 1

In our poster, we present SEM as an effective method for surface roughness measurements, capable of characterizing samples across micro- to nanometer scales with higher lateral resolution than conventional optical techniques.

We demonstrate this by comparing SEM-measured roughness values against a commercial silicon roughness standard, using our point electronic BSE-topography system and MountainsMap software for ISO 25178-compliant analysis.

Poster Session 1

Dr. Grigore Moldovan
CTO

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Video frame rate STEM with beam position correction via scan shaping

Tuesday, September 1, 2026
5:30 PM (Europe/London)
Poster Session 2

This poster demonstrates how scan shaping enables high-speed STEM imaging beyond traditional coil limitations, achieving 41 fps at 512×512 with 60 ns pixel dwell time. The team of Trinity College Dublin implemented a method of scan shaping, based on a serpentine scan to achieve high temporal and spatial resolution imaging. The poster also discusses new limiting factors to STEM scan speeds, and approaches to increasing framerates further.

Our contact: info@pointelectronic.de

Poster Session 2

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Empirical formula for non-Lambertian electron backscattering behaviour deduced from Monte Carlo simulations

Thursday, September 3, 2026
5:30 PM (Europe/London)
Poster Session 4

This poster by Physikalisch Technische Bundesanstalt (PTB) demonstrates that electron backscattering does not always follow Lambert’s law and can be described more accurately with an empirical formula derived from Monte Carlo simulations. It highlights how material, electron energy, and sample tilt shape the backscattering signal.

Poster Session 4

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