A range of investigation cases will be discussed with the inputs of experts in both domains. The event will end with a hands-on analysis at Fraunhofer's lab.

Schedule

The workshop will take place on Friday, 23.09.2016 at Fraunhofer CAM, Heideallee 19, Halle.

• 09.00-12.00 Presentations
• 12.00-13.00 Lunch
• 13.00-15.00 Tool Demos

Presentations

• Microprobing to Nanoprobing workflow in FA using versatile probing platforms
  (Guillaume Boetsch, Imina Technologies SA)
• Quantitative EBIC and EBAC/RCI techniques
  ​(Dr. Grigore Moldovan, point electronic GmbH)
• Applications of nano-probing and SEM based current imaging for IC failure analysis
  ​(Jörg Jatzkowski, Fraunhofer CAM)

Registration

Participation is free of charge, but participants need to register before September 14th, 2016 via email to Katja.Stock@imws.fraunhofer.de