M&M 2024
Jul 28, 2024 - Aug 1, 2024
- Huntington Convention Center
- Huntington Convention Center, USA
- Booth no. 429
- mmconference.microscopy.org
About Microscopy and Microanalysis 2024:
The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students and exhibitors in the world.
Microscopy & Microanalysis provides a forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.
point electronic's topics on site:
- REVOLON TEM Scan Controller
- OEM/ODM Electronics and Software
- Electrical Analysis
- Electrical Failure Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
Your contacts on site:
Don't miss our presentations.
Development of chopped Scan Control for Beam Blanking
Thursday, August 1, 2024
9:30 AM (America/New_York)
C08.1 - Vendor Symposium - Room 22
Dr. Grigore (Greg) Moldovan will present a novel method for beam blanking where the beam is deflected using the normal scan control coils into a vacuum or sacrificial point in the sample plane.
This removes the need for additional deflection hardware and places the added complexity of beam blanking only into the scan controller. It enables more flexible control of electron dose and synchronization with external clocks.
Dr. Grigore Moldovan
CTO
Maker’s How To: external TEM scan control
Wednesday, July 31, 2024
5:45 PM (America/New_York)
Booth #429 - point electronic
The workshop on TEM scan control will overview the common techniques and questions that come up as researchers and independent developers make their own systems and solutions. Including scan rotation and zoom, beam blanking, scan amplifiers, signal amplifiers, open interfaces, standardization.
Dr. Grigore Moldovan
CTO
Maker’s How To: external TEM scan control
Thursday, August 1, 2024
5:45 PM (America/New_York)
Booth #429 - point electronic
The workshop on TEM scan control will overview the common techniques and questions that come up as researchers and independent developers make their own systems and solutions. Including scan rotation and zoom, beam blanking, scan amplifiers, signal amplifiers, open interfaces, standardization.
Dr. Grigore Moldovan
CTO