IPFA 2025

Aug 5, 2025 - Aug 8, 2025

Spice Convention Center
Penang, Malaysia
Booth no. A3
ipfaieee.org

About IPFA 2025:

IPFA 2025 is the 32nd IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS and takes place in Penang, Malaysia.

We will participate at booth #A3 with our Partner Shanghai Winner.

point electronic's topics on site:

REVOLON TEM Scan Controller: a new standard in STEM control
Electrical Analysis
Electrical Analysis in TEM
Electrical Analysis in SEM

Your contact on site:

René Hammer

Don't miss our presentations.

Scan-assisted Lock-In RCI and EBIRCH for localization of resistive defects

Thursday, August 7, 2025
10:55 AM (Asia/Kuala_Lumpur)
Room D2

Our talk at IPFA 2025 presents a new solution of scan-assisted beam blanking for Lock-In EFA as an alternative to electrostatic beam blanking. It discusses scan-assisted Lock-In EFA on and applied to two probe EFA measurements on low resistive samples and defects.

Our contact: info@pointelectronic.de

Thursday, 10:55 a.m. - room D2

René Hammer
Product Manager / Scientist

Ultra-low pA-level noise EBIC and RCI of high impedance samples

Thursday, August 7, 2025
1:05 PM (Asia/Kuala_Lumpur)
Room D1

This talk at IPFA2025 discusses a novel EFA system for low beam-current applications using specialized in situ-preamplification. It shows RCI measurements using low-noise in situ preamplification, with applications.