New collaboration on in-situ microscopy: A High-Temperature BSE topography system for in-situ microscopy is operational on the ThermoFisher Quattro S ESEM at the Electron Microscopy Unit (BEEM) at Technical University of Hamburg (TUHH). Under the expertise of Dr. Martin Ritter, Dr. Tobias Krekeler and Dr. Gunnar Schaan, BEEM – TUUH’s central scientific operating unit - we're advancing our in-situ analysis solutions, now with the point electronic High-Temperature BSE detector.

Featuring a 4-quadrant geometry and a bias voltage, the High-Temperature BSE topography system enables quantitative live measurements of surface heights even at extreme temperatures. The unique electrode-based detector design make the system resilient to light and thermal electrons emitted by hot samples, and easy to maintain and use.

Many thanks to the BEEM team for their dedication – we wish you successful scientific exploration and discovery. A big thank you also to our CTO Dr. Grigore for expert installation and scientific support.