SEM Modernization
Cutting-edge electronics and software for SEMs, for extended life and warranty time
TEM Modernization
Complete electronics and software for ZEISS EM 109/900 TEMs
SEM Electrical Analysis
quantitative electronics and software for electrical analysis in SEM and FIB/SEM.
TEM Electrical Analysis
In-situ imaging of electrical activity at the nanoscale
Electrical Failure Analysis
Equipment for entry-level to cutting edge
BSE Acquisition
Quantitative BackScattered Electron (BSE) acquisition system
Topographic Analysis
Live and calibrated BSE height measurements
3D Calibration Kit
Topography calibration for electron microscopes
STEM Counting
Low-dose imaging with single electron counting
Digital Image Scanning
Digital Image Scanning System (DISS) for SEM and TEM
