MC 2025
Aug 31, 2025 - Sep 4, 2025
- Messe Karlsruhe
- Karlsruhe, Germany
- Booth no. 7b
- www.microscopy-conference.de
About Microscopy Conference:
The Microscopy Conference 2025 in Karlsruhe, organized by the Austrian, German, and Swiss Societies for Electron Microscopy (ASEM, DGE, SSOM), is expected to bring together over 1,000 participants from various countries. The event will serve as a platform for international scientific exchange and advancements in the field of microscopy.
Our partner solutions on site:
At our booth, we will be proudly showcasing cutting-edge partner solutions:
Imina Technologies S.A.: SEM Nanoprobing and Electrical Failure Analysis
Setting new standards in localizing and understanding device failures:
- User-friendly, streamlined workflow
- Efficient, robust and safe probing
- Ready for advanced technology nodes
- Electrical characterization
- Electron beam collection techniques
- Enabling advanced technologies and correlative analysis
Spicer Consulting: Magnetic Field Cancelling
- AC and DC interference cancelling
- Image improvement
- Site Surveys
- Room Planning service
point electronic's topics on site:
- REVOLON TEM Scan Controller: a new standard in STEM control
- OEM/ODM Electronics and Software: Fast and cost effective electronics design tailored to custom specifications.
- BSE Detection: material density mapping with high spatial resolution, hot sample characterization, even at temperatures over 1,000ºC
- BSE Topografie: quantitatitve heigt measurements
- 3D Calibration: calibration for SEM and AFM
- Electrical Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
- REM Modernisierungen: a second life for your existing SEM – with complete new electronics and software
Your contact on site:
Don't miss our presentations.
Development of chopped scan mode with lock-in amplification for electrical analysis of devices
Tuesday, September 2, 2025
2:00 PM (Europe/Berlin)
poster session 9 - poster ID IMP3.P22
Our poster at MC2025 in Karlsruhe presents a novel technique to improve electrical analysis (EA) of integrated circuits (ICs) using electron microscopy, where traditional methods struggle to measure extremely low pA-level currents due to noise and beam limitations. It introduces a lock-in amplification strategy that modulates the electron beam using existing scan coils - rather than specialized beam blankers - to produce a clean, noise-reduced signal. This approach significantly reduces low-frequency noise in resistive contrast imaging (RCI), especially for low-ohmic devices, enabling faster and more reliable mapping.
Our contact: info@pointelectronic.de
Tuesday - poster session 9 - poster ID IMP3.P22
Dr. Grigore Moldovan
CTO
Towards Cinematic STEM: Fast frame rates with scan shaping
Monday, September 1, 2025
2:00 PM (Europe/Berlin)
poster session 2 – poster ID IMP1.P15
The poster at MC2025 in Karslruhe by Lewys Jones from Trinity College Dublin, presents a new scanning strategy for Scanning Transmission Electron Microscopy (STEM) aimed at achieving much higher imaging speeds - towards 50 fps with ~50 ns per pixel with fully sampled images - on existing systems. Traditional scan methods faced limitations due to flyback distortions and hardware constraints, but the proposed serpentine scan pattern and overdrive correction mitigate these issues by smoothing beam motion and correcting for non-linearities. This approach enables faster, distortion-corrected imaging without requiring new hardware, making high-speed STEM more accessible. The experiment setup included the point electronic DISS6 SEM scan controller.
Our contact: info@pointelectronic.de
Monday - poster session 2 - poster ID IMP1.P15
In situ and operando electron microscopy investigation of Pt surface dynamics under H₂ and O₂ environments
Wednesday, September 3, 2025
2:00 PM (Europe/Berlin)
poster session 21 - poster ID MS7.P29
This poster at MC2025 in Karlsruhe by Meimei Wang, Technical University of Munich, presents the analysis of a catalyst surface restructuring during high-temperature reactions using operando scanning electron microscopy (SEM) to study Pt/Rh catalysts relevant to ammonia oxidation. By combining secondary electron, absorbed current, and high-temperature backscattered electron imaging with EBSD, the researchers track real-time grain orientation-dependent surface changes under controlled H₂/O₂ atmospheres. This electron microscopy approach enables detailed analysis of restructuring dynamics, volatile species formation, and morphology evolution, providing insights into catalyst degradation mechanisms and guiding future improvements.
Our contact: info@pointelectronic.de
Wednesday - poster session 21 - poster ID MS7.P29
Take part in our point electronic ice cream giveaway.
Monday, September 1, 2025
10:00 AM (Europe/Berlin)
NOT A TALK, BUT A VERY COOL THING:
Get a point electronic signature ice cream.
Stop by our booth #7b, follow us, and cool off with a sweet treat on us.
We look forward to seeing you!