M&M 2025
Jul 27, 2025 - Jul 31, 2025
- Salt Palace Convention Center
- Salt Lake City, USA
- Booth no. #2136
- mmconference.microscopy.org
About Microscopy and Microanalysis 2025:
The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students and exhibitors in the world.
Microscopy & Microanalysis provides a forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.
point electronic's topics on site:
- REVOLON TEM Scan Controller
- OEM/ODM Electronics and Software
- Electrical Analysis
- Electrical Failure Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
Your contacts on site:
Don't miss our presentations.
Development of chopped Scan Control for Beam Blanking
Wednesday, July 30, 2025
3:00 PM (America/Boise)
Poster Session A07.P1 - poster no. 2063707
With our poster, we show a novel lock-in amplification method using standard scan coils instead of specialized beam blankers.
It enables significant noise reduction, improved measurement sensitivity, and broader accessibility without additional hardware.
Dr. Grigore Moldovan
CTO
Towards Cinematic STEM and Beyond: Fast frame rates using overdriven scan shaping
Thursday, July 31, 2025
8:30 AM (America/Boise)
151 DEF
held by: Lewys Jones, Trinity College Dublin
Depth information from backscattered scanning electron microscope images using multiple beam energies and parameter estimation methods
Monday, July 28, 2025
2:00 PM (America/Boise)
251 A
We demonstrate how analyzing backscattered electron SEM images of nanoporous samples at multiple beam energies enables separation of surface and sub-surface signals - leveraging the shine-through effect - to improve 3D structural reconstruction using least-squares parameter estimation.
The talk is held by Dr. Martin Ritter, Hamburg University of Technology
Perspectives and Limitations of STEM EBIC Measurements for the Characterization of Semiconductor Devices
Tuesday, July 29, 2025
11:30 AM (America/Boise)
151 DEF
This talk discusses the use of STEM EBIC measurements on a commercial silicon photodiode to investigate nanoscale charge transport and the influence of sample preparation, particularly thickness and Ga implantation, on signal quality and electrical behavior. The measurements were carried out using a JEOL Jem F-200C microscope equipped with an electrical analysis system from point electronic. This setup enabled high-resolution visualization of the photodiode’s depletion region and supported advanced complementary techniques like DPC and electron holography.
DISS6 (point electronic) and Felis camera (ASI) making 4D STEM in SEM affordable
Monday, July 28, 2025
5:45 PM (America/Boise)
at our point electronic booth 2136
Vendor Tutorial: DISS6 is an open-access SEM scan generator enabling highest scan speed and hardware synchronization. The Felis detector is a hybrid pixel detector (HPD) by Amsterdam Scientific Instruments, which is based on the Timepix3 ASIC. Integrated together into a new solution, they bring the extreme richness of 4D-STEM techniques into SEM, including an extremely high effective frame rate due to the nature of the event-driven data.
Monday, 5:45 p.m.
Future-Proof your SEM: How Modernizations will give your SEM a second life
Tuesday, July 29, 2025
5:45 PM (America/Boise)
at our point electronic booth 2136
- Is your SEM column still going strong, but the electronics and software are outdated?
- Did you know that you can modernize your SEM with a modern, low-interference, high-speed electronics package and boost performance and efficiency for years to come?
With SEM Modernization from point electronic, you can enjoy user-friendly software, automation, and OS compatibility, all at a fraction of the cost of a new SEM.
Attend our vendor tutorial and learn why 250+ customers chose to modernize their SEMs and make them state-of-the-art with point electronic.
Tuesday, 5:45 p.m.
A new level of integration: DECTRIS NOVENA combined with REVOLON’s free, fast and flexible STEM control
Wednesday, July 30, 2025
5:45 PM (America/Boise)
at our point electronic booth 2136
Vendor Tutorial: Can you speed up STEM mode in your TEM to > 35 fps? REVOLON is designed for flexible, high-speed electron microscopy. The TEM scan controller allows unrestricted access to the electron beam supporting pixel maps and advanced scanning modes. For fast scanning, REVOLON delivers maximum speed for in-situ STEM, featuring ultra-fast hardware-level communication with external devices like 4D-STEM cameras and enabling gapless frames.
REVOLON is compatible with a wide range of TEM hardware and software, including DECTRIS 4D STEM cameras and NOVENA Acquire.
Wednesday, 5:45 p.m.