M&M 2025
Jul 27, 2025 - Jul 31, 2025
- Salt Palace Convention Center
- Salt Lake City, USA
- Booth no. #2134
- mmconference.microscopy.org
About Microscopy and Microanalysis 2025:
The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students and exhibitors in the world.
Microscopy & Microanalysis provides a forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.
point electronic's topics on site:
- REVOLON TEM Scan Controller
- OEM/ODM Electronics and Software
- Electrical Analysis
- Electrical Failure Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
Your contacts on site:
Don't miss our presentations.
Development of chopped Scan Control for Beam Blanking
Wednesday, July 30, 2025
3:00 PM (America/New_York)
C08.1 - Vendor Symposium - Room 22
With our poster, we show a novel lock-in amplification method using standard scan coils instead of specialized beam blankers.
It enables significant noise reduction, improved measurement sensitivity, and broader accessibility without additional hardware.
Dr. Grigore Moldovan
CTO
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Towards Cinematic STEM and Beyond: Fast frame rates using overdriven scan shaping
Thursday, July 31, 2025
8:30 AM (America/New_York)
Session P10.8
held by: Lewys Jones, Trinity College Dublin
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