National Conference on Electron Microscopy 2025
Sep 26, 2025 - Sep 30, 2025
- Wuhan International Conference Center
- Wuhan, China
- Booth no. booth of Shanghai Winner
- mp.weixin.qq.com
About the National Conference on Electron Microscopy 2025:
The National Conference on Electron Microscopy is organized by the Chinese Electron Microscopy Society and has its second edition in 2025.
Meet us at the booth of our partner Shanghai Winner.
point electronic's topics on site:
- REVOLON TEM Scan Controller: a new standard in STEM control
- PULSE signal digitizer: PULSE by turboTEM is a real time signal processor that enables digital imaging without the expense of replacing your existing analog detector.
- Electrical Analysis in TEM
- Electrical Analysis in SEM
- BSE Topography: quantitatitve heigt measurements
- BSE Detection: material density mapping with high spatial resolution, hot sample characterization, even at temperatures over 1,000ºC
Your contact on site:
Our talk:
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