Our point electronic GmbH colleague René Hammer, together with JEOL Ltd. Italia service engineer Lorenzo Rogliani, installed the Electrrical Analysis system on a FE-SEM JSM-IT800 for the CNR-IMM (Istituto per la microelettronica e microsistemi) team led by Stefania Privitera and R. Gabriella Milazzo. For this project, our two companies have worked closely together.

The CNR team will study solar cells, single photon detectors and other devices, like diodes, sensors or memory, that are manufactured in their laboratory. “With the EA system from point electronic, we have the possibility to have more insight on the effect of edge structures and of defects and to identify the failure mechanisms,” says Stefania Privitera.

The EA system from point electronic enables advanced EBIC, with ultra-fast multi-channel imaging, live color mixing, quantitative signals, in-situ preamplification, and integrated lock-in electrical analysis.

It was seamlessly integrated into the JEOL JSM-IT800SHL (Schottky FE-SEM with JEOL Gather-X EDS and Super Hybrid Lens), including full automation and connection to SEM parameters.

Both teams, JEOL (ITALIA) SpA and CNR-IMM, feedbacked the installation as efficient and easy.

"We have received full support for questions and suggestions to improve our analysis," says Stefania Privitera.

We thank Stefania Privitera, R. Gabriella Milazzo and the entire CNR-IMM team – we wish you continued success with the SEM! A big thank you as well to JEOL (ITALIA) SpA, especially Gabriele Bulla, Paolo Grianti and Lorenzo Rogliani, for the great support and inspiring collaboration!