New collaboration on STEM Counting for Metrology
The STEM Counting system is installed at the LENA, a joint initiative of PTB Braunschweig and TU Braunschweig. Under the expert guidance of Dr. Daesung Park, point electronic GmbH is taking a significant step toward advancing quantitative acquisition in STEM metrology.
The STEM Counting system is now operational on the JEOL NeoArm 200F TEM at the Laboratory for Emerging Nanometrology (LENA), a joint initiative between the Physikalisch-Technische Bundesanstalt, PTB and Technische Universität Braunschweig. Under the expert guidance of Dr. Daesung Park, point electronic GmbH is taking a significant step toward advancing quantitative acquisition in STEM metrology.
The STEM Counting system enhances existing STEM detectors by incorporating a state-of-the-art turboTEM PULSE single electron processor along with a new point electronic GmbH REVOLON scan controller.
This innovative setup generates quantitative images with calibrated units of individual electrons, ensuring a true zero background level and significantly reducing noise, which in turn boosts the reliability of measurements.
Additionally, Electron Counting minimizes the need for post-hoc data analysis, improves the accuracy and precision of real-time results, while saving time and resources.