Thursday, November 14, 2024

New collaboration on STEM Counting for Metrology

The STEM Counting system is installed at the LENA, a joint initiative of PTB Braunschweig and TU Braunschweig. Under the expert guidance of Dr. Daesung Park, point electronic GmbH is taking a significant step toward advancing quantitative acquisition in STEM metrology.

Dr. Daesung Park, head of the
Dr. Daesung Park, head of the "Quantitative Analysis with STEM" research group at Physikalisch-Technische Bundesanstalt (PTB), stands with Dr. Grigore Moldovan, CTO of point electronic GmbH, in front of the Jeol microscope, now equipped with an Electron Counting system provided by point electronic GmbH.

The STEM Counting system is now operational on the JEOL NeoArm 200F TEM at the Laboratory for Emerging Nanometrology (LENA), a joint initiative between the Physikalisch-Technische Bundesanstalt, PTB and Technische Universität Braunschweig. Under the expert guidance of Dr. Daesung Park, point electronic GmbH is taking a significant step toward advancing quantitative acquisition in STEM metrology.

The STEM Counting system enhances existing STEM detectors by incorporating a state-of-the-art turboTEM PULSE single electron processor along with a new point electronic GmbH REVOLON scan controller.

This innovative setup generates quantitative images with calibrated units of individual electrons, ensuring a true zero background level and significantly reducing noise, which in turn boosts the reliability of measurements.

Additionally, Electron Counting minimizes the need for post-hoc data analysis, improves the accuracy and precision of real-time results, while saving time and resources.