About the CMC Workshop 2024:
The Correlative Materials Characterization Workshop 2024 will focus on light microscopy, electron microscopy, X-ray microscopy, and atomic force microscopy. Satellite event is the European School for Young Materials Scientists 2024.
point electronic's topics on site:
- REVOLON TEM Scan Controller: a new standard in STEM control
- Electrical Analysis in TEM
- Electrical Analysis in SEM
- REM Modernisierungen: a second life for your existing SEM – with complete new electronics and software
Your contact on site:
Our talk:
Simultaneous multi-channel multi-technique imaging for quick and direct correlative characterization in SEM and STEM
Dr. René Hammer