ISTFA 20235
Nov 16, 2025 - Nov 20, 2025
- Pasadena Convention Center
- Pasadena, USA
- Booth no. 509
- www.asminternational.org
About ISTFA:
The 51st International Symposium for Testing and Failure Analysis (ISTFA) is an important international event for the microelectronics failure analysis community.
point electronic GmbH will be on site at the joint booth 509 with our partner Angstrom Scientifc.
point electronic's topics on site:
- Electrical Analysis
- Electrical Failure Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
Your contact on site:
Don't miss our talk.
Don't miss our presentations.
Scan-assisted Lock-In RCI and EBIRCH for localization of resistive defects
Tuesday, November 18, 2025
1:50 PM (America/Los_Angeles)
Our talk at ISTFA 2025 presents a new solution of scan-assisted beam blanking for Lock-In EFA as an alternative to electrostatic beam blanking. It discusses scan-assisted Lock-In EFA on and applied to two probe EFA measurements on low resistive samples and defects.
Our contact: info@pointelectronic.de
Thursday, 1:50 p.m.
René Hammer
Product Manager / Scientist
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