About Microscopy and Microanalysis 2027:
The M&M conference is the largest scientific meeting and gathering of microscopy and microanalysis professionals, academics, technicians, students and exhibitors in the world.
Microscopy & Microanalysis provides a forum for the presentation and discussion of a wide range of microscopy and microanalysis techniques and their application to the biological and physical sciences.
point electronic's topics on site:
- REVOLON TEM scan controller: Fastest scanning and 4D STEM synchronization with open access to beam control via SDK and Python code.
- DISS6 SEM scan controller: highest-performance and most versatile scan generator and imaging system
- Topographic Analysis: quantitative and calibrated measurement of surface height with live 3D visualization
- SEM Modernizations: A second life for your existing SEM – with complete new electronics and software for the fraction of the costs of a new microscope.
- OEM/ODM Electronics and Software: High-speed, reliable and cost-efficient design solutions ready for series production.
- Electrical Analysis in TEM: Correlation of electrical activity with high resolution data
- Electrical Analysis in SEM: Electrical Analysis system for high-quality visualization of electronic properties and defects