The Electrical Analysis (EA) in TEM system enables to correlate in-situ electrical activity with high resolution data. And we are proud to now offer it for Chungnam National University at the TEM of the National NanoFab Center (NNFC) in Korea this week. It is the first time that we installed our system together with a DENSSolutions holder.

The Electrical Analysis system enables to correlate in-situ electrical activity with high resolution data. And we are proud to now offer it for DENSSolutions holders.

We thank our partner DENSsolutions very much for the great cooperation and support for the smooth integration of the system. It also marks a successful milestone in our joint partnership in the In-Situ Microscopy Alliance.

Our system for Electrical Analysis in TEM includes an amplifier for low-noise current amplification for biasing holders, and our REVOLON scan controller. It is fully integrated and software controlled and and supports electrical analysis techniques like EBIC, RCI and EBIRCH.

We thank the NNFC team and wish them continued success in their scientific exploration and discovery!