SEM Nanoprobing and Electrical Failure Analysis for next-generation semiconductors - we are happy that our joint workshop with hands-on discussions and live demonstrations this week here in Halle was so well received.

The workshop was organized by Imina Technologies SA and point electronic GmbH in collaboration with Fraunhofer Institute for Microstructure of Materials and Systems IMWS.

It focused on efficient nanoprobing workflows, including fast sample navigation, precise probe landing, and stable electrical contacting, and also discussed recent developments in Electrical Failure Analysis techniques which extend the range of applications.

We demonstrated our in-situ SEM nanoprobing and Electrical Failure Analysis workflow solution in a live demo. Fraunhofer IMWS team shared practical insights and experiences from their work.

A big thank you to Frank Altmann, Jörg Jatzkowski and their team from Fraunhofer IMWS for their warm hospitality, and for the interesting impulses throughout the event.