National Conference on Electron Microscopy 2024
Oct 17, 2024 - Oct 21, 2024
- Dongguan, Guangdong, China
- Dongguan, China
- Booth no. booth of Shanghai Winner
- www.china-em.net.cn
About the National Conference on Electron Microscopy 2024:
The National Conference on Electron Microscopy is organized by the Chinese Electron Microscopy Society and has its second edition in 2024.
Meet us at the booth of our partner Shanghai Winner.
point electronic's topics on site:
- REVOLON TEM Scan Controller: a new standard in STEM control
- PULSE signal digitizer: PULSE by turboTEM is a real time signal processor that enables digital imaging without the expense of replacing your existing analog detector.
- Electrical Analysis in TEM
- Electrical Analysis in SEM
- BSE Topography: quantitatitve heigt measurements
- BSE Detection: material density mapping with high spatial resolution, hot sample characterization, even at temperatures over 1,000ºC
Your contact on site:
Our talks and presentations:
Modification of multi-functional electron microscope (电镜系统控制与改装)
Saturday, Oct 19 - 3:05 - 3:25 pm
TEM Scan Control and real time Signal Pulse Processing - empowerment for your STEM with turboTEM PULSE & point electronic's REVOLON
Sunday, Oct 20 - Luncheon Workshop