That's why the team around Vita Mergner and David Cooperdecided for the latest version of our point electronic GmbH Electrical Analysis for TEM system. It was installed on-site, in Grenoble, by our colleague René Hammer.

The new EA for TEM system now allows for EBIC and RCI measurements in STEM with a significantly improved signal-to-noise ratio.
In practice, it means

• weaker signals become visible,
• finer electrical structures can be resolved, and
• effects that used to disappear into the noise are now measurable.

CEA-Leti Institute accelerates the transfer of research results into real-world applications, helping bridge the gap between fundamental research and practical semiconductor technologies.
Here, David and Vita’s team works on advanced optoelectronic III-V semiconductor systems based on GaN, GaAs, InGaAs, InP, and GaP.

With the EA for STEM system, they can now gain deeper insights into the electrical properties of these materials. Such information is difficult, and in some cases impossible, to access with other techniques such as electron holography or 4D-STEM.

We thank Vita Mergner, David Cooper and the entire CEA-Leti team, and wish you continued success with the Electrical Analysis System.