emc 2024
Aug 25, 2024 - Aug 30, 2024
- Bella Center Copenhagen
- Copenhagen, Denmark
- Booth no. A12
- emc2024.eu
About European Microscopy Congress:
The European Microscopy Congress 2024 (emc2024) brings together the world of scientific imaging.
The focus will be on light and electron microscopy in the physical and biological sciences. The conference brings together microscopists, manufacturers and suppliers to discuss new techniques, applications and technologies.
point electronic's topics on site:
- REVOLON TEM Scan Controller: a new standard in STEM control
- OEM/ODM Electronics and Software: Fast and cost effective electronics design tailored to custom specifications.
- BSE Detection: material density mapping with high spatial resolution, hot sample characterization, even at temperatures over 1,000ºC
- BSE Topografie: quantitatitve heigt measurements
- 3D Calibration: calibration for SEM and AFM
- Electrical Analysis
- Electrical Analysis in TEM
- Electrical Analysis in SEM
- REM Modernisierungen: a second life for your existing SEM – with complete new electronics and software
Your contact on site:
Our poster presentations
Development of chopped scan control for beam blanking
IM-02 -- paper no. 924
Monday - Tuesday, 26-27 August, 16.00 - 18.30
3D calibration for SEM and optical microscopy - First results with next generation 3D standards
IM-04 -- paper no. 831
Monday - Tuesday, 26-27 August, 16.00-18.30
In-Situ microscopy study on self-healing process of vitrimers
IM-01 -- paper no. 1098
Monday - Tuesday, 26-27 August, 16.00-18.30
Pulse counting in the SEM
IM-02 -- paper no. 1330
(by our partner turboTEM)
Monday - Tuesday, 26-27 August, 16.00-18.30
NOT A TALK, BUT A VERY COOL THING:
Get a point electronic signature ice cream!
Stop by our booth #A12, follow us, and cool off with a sweet treat on us.
We look forward to seeing you!
Ice cream times: Monday, Tuesday and Wednesday | 14 – 16 pm
Don't miss our presentations.
Development of chopped scan control for beam blanking
Monday, August 26, 2024
4:00 PM (Europe/Berlin)
A novel method for beam blanking where the beam is deflected using the normal scan control coils into a vacuum or sacrificial point in the sample plane. This removes the need for additional deflection hardware and places the added complexity of beam blanking only into the scan controller. It enables more flexible control of electron dose and synchronization with external clocks.
3D calibration for SEM and optical microscopy - First results with next generation 3D standards
Monday, August 26, 2024
4:00 PM (Europe/Berlin)
Current 3D standards produced via FIB are expensive, custom-made, and require time-consuming calibration, with limited size and application range. To address these limitations, we developed a wafer-based mask process for 3D standard fabrication.
In-situ microscopy study on self-healing vitrimers
Monday, August 26, 2024
4:00 PM (Europe/Berlin)
poster together with Hamburg University of Technology
Pulse counting in the SEM
Monday, August 26, 2024
4:00 PM (Europe/Berlin)
poster by our partner turboTEM
If you want to learn more about the tuboTEM Pulse signal digitizer, visit turboTEM pulse processor.
Take part in our point electronic ice cream giveaway.
Monday, August 26, 2024
2:00 PM (Europe/Berlin)
NOT A TALK, BUT A VERY COOL THING:
Get a point electronic signature ice cream.
Stop by our booth #A12, follow us, and cool off with a sweet treat on us.
We look forward to seeing you!
Ice cream times: Monday, Tuesday and Wednesday | 14 – 16 pm